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beam voltage

См. также в других словарях:

  • Voltage — Potential difference redirects here. For other uses, see Potential. Working on high voltage power lines, Pearl Harbor …   Wikipedia

  • Beam tetrode — The problem of secondary emission in the tetrode tube (valve) was solved by Philips/Mullard with the introduction of a suppressor grid to produce the pentode construction. Since Philips held a patent on this design, other manufacturers were keen… …   Wikipedia

  • beam — Synonyms and related words: AM signal, CRT spot, DM display, Doppler signal, FM signal, H beam, I beam, IF signal, IF video signal, IM display, RF amplifier, RF echoes, RF signal, RF stage, TV band, X ray, abutment, actinic ray, actinism,… …   Moby Thesaurus

  • Charged particle beam — A charged particle beam is a spatially localized group of electrically charged particles that have approximately the same velocity (speed and direction). The kinetic energies of the particles are typically measured in keV or MeV, much larger than …   Wikipedia

  • Electron beam welding — (EBW) is a fusion welding process in which a beam of high velocity electrons is applied to the materials being joined. The workpieces melt as the kinetic energy of the electrons is transformed into heat upon impact, and the filler metal, if used …   Wikipedia

  • Electron Beam Prober — The Electron Beam Prober (E beam Prober) is a specialized adaption of a standard Scanning Electron Microscope (SEM) that is used for semiconductor failure analysis. While a standard SEM may be operated in a voltage range of 25KeV to 30KeV, the E… …   Wikipedia

  • Particle beam weapon — A particle beam weapon uses an ultra high energy beam of atoms or electrons (i.e., a particle beam) to damage a material target by hitting it, and thus disrupting its atomic and molecular structure. A particle beam weapon is a type of directed… …   Wikipedia

  • Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… …   Wikipedia

  • Electron beam physical vapor deposition — or EBPVD is a form of physical vapor deposition in which a target anode is bombarded with an electron beam given off by a charged tungsten filament under high vacuum. The electron beam causes atoms from the target to transform into the gaseous… …   Wikipedia

  • Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… …   Wikipedia

  • Ion beam deposition — (IBD) is a process of applying materials to a target through the application of an ion beam.In an ion source source materials gases or evaporated solids are ionized using electron ionization or by application of high electric fields (Penning ion… …   Wikipedia

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